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Found 1 from your keywords: author=Grasser, Tibor
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Bias Temperature Instability for Devices and Circuits
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Grasser, Tibor

This book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory,…

Edition
-
ISBN/ISSN
978-1-4614-7909-3
Collation
xi,810p.: III.
Series Title
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Call Number
537.6221 Bia