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Found 1 from your keywords: author=Artola,Laurent
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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
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Zimpeck, AlexandraMeinhardt,CristinaArtola,LaurentReis, Ricardo

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical prop…

Edition
1
ISBN/ISSN
978-3-030-68368-9
Collation
XIII, 131p.:Ill
Series Title
-
Call Number
621.381 528 4 Mit