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Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs
This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error estimation, the authors adopt a radiation event generator tool (MUSCA SEP3), which deals both with layout features and electrical prop…
- Edition
- 1
- ISBN/ISSN
- 978-3-030-68368-9
- Collation
- XIII, 131p.:Ill
- Series Title
- -
- Call Number
- 621.381 528 4 Mit
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